Strain_4D-ED
1. This program is
running on IBM compatible personal computers under Windows95/98, Windows NT,
Windows XP, Windows 7 (32 bit), Windows 8, Windows 10, Windows 11 or
compatible operating systems.
2. Strain_4D-ED
calculates strain maps from a set of diffraction patterns recorded at each
pixel of a scanned rectangle in a STEM.
·
Input files are expected in Tif (non-compressed, gray
scale) format.
·
The diffraction patterns are collected independently
from Strain_4D-ED, by the control software of the STEM.
3. To install the
program, click Download below. Select a temporary directory in your computer for destination. A file named Install_Strain_4D-ED.exe
will be downloaded.
4. Extract the setup
files by running Install_Strain_4D-ED.exe.
Select the same temporary directory for the destination of extraction.
5. Run Setup from the
same directory. Accept the offered destination directory (\Program Files\ProcessDiffraction_Suite). Wait for Setup to complete.
6. Delete your
temporary directory or keep the installation files as you wish.
7.
If you find this program useful, you may consider
citing the publication below.
"Strain measurement in single crystals by 4D-ED”,
Nanomaterials 2023, 13, 1007.
https://doi.org/10.3390/nano13061007
8.
Please report any
problems or suggestions to labar.janos@ek-cer.hu
9.
Free subscription
is granted with the program. You can visit this dowload
page annually to check for new updates.
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